"Temperature error minimization in low dose radiation measurements with 140 nm MOS dosimeters" (2010) Carbonetto, S.H.;Inza, M.A.G.;Lipovetzky, J. (...)Faigón, A. 4th Argentine School of Micro-Nanoelectronics, Technology and Applications and 1st Uruguay School of Micro-Nanoelectronics, Technology and Applications, EAMTA 2010:71-75

"Ring oscillators response to irradiation and application to dosimetry" (2009) Carbonetto, S.;Lipovetzky, J.;Inza, M.G. (...)Faigón, A. Argentine School of Micro-Nanoelectronics, Technology and Applications 2009, EAMTA 2009:1-4

"Temperature effects on metal oxide semiconductor dosimeters during switched bias irradiation" (2009) Lipovetzky, J.;Redin, E.;Inza, M.G. (...)Faigón, A. Argentine School of Micro-Nanoelectronics, Technology and Applications 2009, EAMTA 2009:41-45

"A computational dosimetry tool for the study of tumor doses and skin toxicities in BNCT" (2009) Gossio, S.; Carando, D.G.; González, S.J. Applied Radiation and Isotopes. 67(7-8 SUPPL):S145-S148

"Stand alone MOS dosimetry system for high dose ionizing radiation" (2009) Inza, M.G.;Lipovetzky, J.;Redin, E. (...)Faigon, A. Argentine School of Micro-Nanoelectronics, Technology and Applications 2009, EAMTA 2009:27-30

"Extension of the measurement range of MOS dosimeters using radiation induced charge neutralization" (2008) Faigón, A.; Lipovetzky, J.; Redin, E.; Krusczenski, G. IEEE Transactions on Nuclear Science. 55(4):2141-2147