Artículo
Plá, J.C.; Durán, J.C.; Skigin, D.C.; Depine, R.A. "Ray tracing vs. electromagnetic methods in the analysis of antireflective textured surfaces: A first approach" (1998) Optik (Jena). 107(4):141-144
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Abstract:
We investigate the validity of the ray optics approach for the analysis of antireflecting structures used in photovoltaic solar cells. The antireflecting structure is simulated by a periodic grating with triangular profile and the reflected fields are calculated using two methods: one based on the ray optics approach and the other based on rigorous electromagnetic theory. As a first approach to the real problem, we consider a perfect conductive media. The parameter used for the characterisation of the problem is the wavelength to period ratio λ/d. The theoretical analysis presented here shows important discrepancies between the results obtained using the ray tracing approximation and those obtained using a rigorous electromagnetic method, even for small values of λ/d (of the order of 0.1) for which the geometrical optics approach is usually expected to hold.
Registro:
| Documento: | Artículo |
| Título: | Ray tracing vs. electromagnetic methods in the analysis of antireflective textured surfaces: A first approach |
| Autor: | Plá, J.C.; Durán, J.C.; Skigin, D.C.; Depine, R.A. |
| Filiación: | Departamento de Física, Centro Atómico Constituyentes, Comn. Nac. de Ener. Atómica, Villa Maipú, Argentina Grupo de Electromagnetismo Aplicado, Departamento de Fisica, Universidad de Buenos Aires, Argentina Departamento de Física, Centro Atómico Constituyentes, Comn. Nac. de Ener. Atómica, Avda. General Paz km 6.5, 1650 Villa Maipú, Argentina Departamento de Física, Universidad de Buenos Aires, Ciudad Universitaria, 1428 Buenos Aires, Argentina |
| Palabras clave: | Approximation theory; Conductive materials; Diffraction gratings; Electromagnetic field theory; Optics; Antireflective textured surfaces; Ray tracing; Antireflection coatings |
| Año: | 1998 |
| Volumen: | 107 |
| Número: | 4 |
| Página de inicio: | 141 |
| Página de fin: | 144 |
| Título revista: | Optik (Jena) |
| Título revista abreviado: | Optik (Jena) |
| ISSN: | 00304026 |
| CODEN: | OTIKA |
| Registro: | https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_00304026_v107_n4_p141_Pla |
Referencias:
- Sopori, B.L., Pryor, R.A., Design of antireflection coatings for textured silicon solar cells (1983) Sol. Cells, 8, pp. 249-261
- Smith, A.W., Rohatgi, A., Ray tracing analysis of the inverted pyramid texturing geometry for high efficiency silicon solar cells (1993) Sol. Energy Mater. Sol. Cells, 29, pp. 37-49
- Zaho, J., Green, M.A., Optimized antireflection coatings for high-efficiency silicon solar cells (1991) IEEE Trans. Electron Devices, 38, pp. 1925-1934
- King, D.L., Buck, M.E., Experimental optimization of an anisotropic etching process for random texturization of silicon solar cells (1991) Proceedings of the 22nd. IEEE Photovoltaic Specialists' Conference, pp. 303-308
- Zhao, J., Wang, A., Green, M.A., 24% efficient PERL structure silicon solar cells (1990) Proceedings of the 21st. IEEE Photovoltaic Specialists' Conference, pp. 333-335
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- Petit, R., (1980) Electromagnetic Theory of Gratings, , Springer-Verlag, New York
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- Li, L., Multilayer modal method for diffraction gratings of arbitrary profile, depth, and permittivity (1993) J. Opt Soc. Am. A, 10, pp. 2581-2591
Citas:
---------- APA ----------
Plá, J.C., Durán, J.C., Skigin, D.C. & Depine, R.A. (1998) . Ray tracing vs. electromagnetic methods in the analysis of antireflective textured surfaces: A first approach. Optik (Jena), 107(4), 141-144.Recuperado de https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_00304026_v107_n4_p141_Pla [ ]
---------- CHICAGO ----------
Plá, J.C., Durán, J.C., Skigin, D.C., Depine, R.A. "Ray tracing vs. electromagnetic methods in the analysis of antireflective textured surfaces: A first approach" . Optik (Jena) 107, no. 4 (1998) : 141-144.Recuperado de https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_00304026_v107_n4_p141_Pla [ ]
---------- MLA ----------
Plá, J.C., Durán, J.C., Skigin, D.C., Depine, R.A. "Ray tracing vs. electromagnetic methods in the analysis of antireflective textured surfaces: A first approach" . Optik (Jena), vol. 107, no. 4, 1998, pp. 141-144.Recuperado de https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_00304026_v107_n4_p141_Pla [ ]
---------- VANCOUVER ----------
Plá, J.C., Durán, J.C., Skigin, D.C., Depine, R.A. Ray tracing vs. electromagnetic methods in the analysis of antireflective textured surfaces: A first approach. Optik (Jena). 1998;107(4):141-144.Available from: https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_00304026_v107_n4_p141_Pla [ ]
