Artículo

Oswal, M.; Kumar, S.; Singh, U.; Singh, G.; Singh, K.P.; Mehta, D.; Mitnik, D.; Montanari, C.C.; Nandi, T. "L x-ray production cross sections in high-Z atoms by 3–5 MeV/u silicon ions" (2018) Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms. 416:110-118
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Abstract:

Total L x-ray production cross sections have been measured in 74 W, 79 Au, 82 Pb, and 83 Bi by impact of 3–5 MeV/u 28 Si ions, with different charge states q = 8 + up to 12 + . We find that the measured cross sections do not differ with the charge state of the projectile ions, but they vary with the beam energies. The experimental data has been compared with three theoretical results, ECUSAR, ECPSSR and SLPA by using the multiple-hole fluorescence and Coster-Kronig yields. The comparison has showed the best agreement with the ECUSAR. The SLPA results also describe the experiments quite well for 74 W, 79 Au and 83 Bi, but certain differences are observed for 82 Pb, while the ECPSSR values underestimate by up to a factor two. Surprisingly, the theoretical-experimental agreement is better at low beam energies than in the high beam energy side. © 2017 Elsevier B.V.

Registro:

Documento: Artículo
Título:L x-ray production cross sections in high-Z atoms by 3–5 MeV/u silicon ions
Autor:Oswal, M.; Kumar, S.; Singh, U.; Singh, G.; Singh, K.P.; Mehta, D.; Mitnik, D.; Montanari, C.C.; Nandi, T.
Filiación:Department of Physics, Dev Samaj College, Sec 45-B, Chandigarh, 160047, India
Department of Physics, Panjab University, Chandigarh, 160014, India
Department of Applied Sciences, Chitkara University, Himachal Pradesh, 174103, India
The Marian Smoluchowski Institute of Physics, Jagiellonian University, Lojasiewicza 11, Krakow, 30-348, Poland
Department of Physics, Punjabi University, Patiala, Punjab 147002, India
Instituto de Astronomía y Física del Espacio, CONICET and Universidad de Buenos Aires, Buenos Aires, Argentina
Inter-University Accelerator Centre, JNU New Campus, New Delhi, 110067, India
Palabras clave:Heavy ions; Ionization; L-shell x-rays; Multiple-ionization; Heavy ions; Ionization; X ray scattering; Beam energies; Charge state; L shell; Low beam; Multiple holes; Multiple ionization; Projectile ions; Silicon ion; X ray production
Año:2018
Volumen:416
Página de inicio:110
Página de fin:118
DOI: http://dx.doi.org/10.1016/j.nimb.2017.11.025
Título revista:Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Título revista abreviado:Nucl Instrum Methods Phys Res Sect B
ISSN:0168583X
CODEN:NIMBE
Registro:https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_0168583X_v416_n_p110_Oswal

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Citas:

---------- APA ----------
Oswal, M., Kumar, S., Singh, U., Singh, G., Singh, K.P., Mehta, D., Mitnik, D.,..., Nandi, T. (2018) . L x-ray production cross sections in high-Z atoms by 3–5 MeV/u silicon ions. Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 416, 110-118.
http://dx.doi.org/10.1016/j.nimb.2017.11.025
---------- CHICAGO ----------
Oswal, M., Kumar, S., Singh, U., Singh, G., Singh, K.P., Mehta, D., et al. "L x-ray production cross sections in high-Z atoms by 3–5 MeV/u silicon ions" . Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms 416 (2018) : 110-118.
http://dx.doi.org/10.1016/j.nimb.2017.11.025
---------- MLA ----------
Oswal, M., Kumar, S., Singh, U., Singh, G., Singh, K.P., Mehta, D., et al. "L x-ray production cross sections in high-Z atoms by 3–5 MeV/u silicon ions" . Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, vol. 416, 2018, pp. 110-118.
http://dx.doi.org/10.1016/j.nimb.2017.11.025
---------- VANCOUVER ----------
Oswal, M., Kumar, S., Singh, U., Singh, G., Singh, K.P., Mehta, D., et al. L x-ray production cross sections in high-Z atoms by 3–5 MeV/u silicon ions. Nucl Instrum Methods Phys Res Sect B. 2018;416:110-118.
http://dx.doi.org/10.1016/j.nimb.2017.11.025