Abstract:
We show that the orientation of a dimer and the distance between the nanoparticles that form it can be determined by measuring the scattering under polarized light illumination. Scattering microscopy has shown to be an alternative to fluorescence as it provides nonbleaching and highly biocompatible probes, that can be manufactured in different sizes with different ligands. We propose a method based on measuring the polarization anisotropy of metallic dimers to determine distances in the range from 10 nm to 200 nm, thus filling the gap between fluorescence resonance energy transfer (FRET) and conventional microscopy. By calculating the scattering cross section of metallic dimers we show that it is also possible to gather orientation information, relevant to understand many biological processes. © 2006 Optical Society of America.
Registro:
Documento: |
Artículo
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Título: | Distance and orientation measurement in the nanometric scale based on polarization anisotropy of metallic dimers |
Autor: | Grecco, H.E.; Martínez, O.E. |
Filiación: | Laboratorio de Electrónica Cuántica, Departamento de Física, Ciudad Universitaria, Pabellón 1, C1428EHA Buenos Aires, Argentina
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Palabras clave: | Anisotropy; Energy transfer; Fluorescence; Information retrieval; Nanostructured materials; Nanotechnology; Polarization; Scattering; Biocompatible probes; Fluorescence resonance energy transfer (FRET); Metallic dimers; Polarization anisotropy; Dimers |
Año: | 2006
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Volumen: | 14
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Número: | 19
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Página de inicio: | 8716
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Página de fin: | 8721
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DOI: |
http://dx.doi.org/10.1364/OE.14.008716 |
Título revista: | Optics Express
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Título revista abreviado: | Opt. Express
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ISSN: | 10944087
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Registro: | https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_10944087_v14_n19_p8716_Grecco |
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Citas:
---------- APA ----------
Grecco, H.E. & Martínez, O.E.
(2006)
. Distance and orientation measurement in the nanometric scale based on polarization anisotropy of metallic dimers. Optics Express, 14(19), 8716-8721.
http://dx.doi.org/10.1364/OE.14.008716---------- CHICAGO ----------
Grecco, H.E., Martínez, O.E.
"Distance and orientation measurement in the nanometric scale based on polarization anisotropy of metallic dimers"
. Optics Express 14, no. 19
(2006) : 8716-8721.
http://dx.doi.org/10.1364/OE.14.008716---------- MLA ----------
Grecco, H.E., Martínez, O.E.
"Distance and orientation measurement in the nanometric scale based on polarization anisotropy of metallic dimers"
. Optics Express, vol. 14, no. 19, 2006, pp. 8716-8721.
http://dx.doi.org/10.1364/OE.14.008716---------- VANCOUVER ----------
Grecco, H.E., Martínez, O.E. Distance and orientation measurement in the nanometric scale based on polarization anisotropy of metallic dimers. Opt. Express. 2006;14(19):8716-8721.
http://dx.doi.org/10.1364/OE.14.008716